Dr Dwyer is originally from Manchester. He attended Cambridge University as an undergraduate in Mathematics and York University where he received his doctorate in Theoretical Physics. After periods at Trinity College, Dublin and Warwick University he joined the Depertment of Electronic and Electrical Engineering, where his is now a Reader in Electronic Devices.
He has published over 70 academic papers (over 50 of which are in academic journals) on a variety of topics but which lately have included the reliability and physics of faillure of VLSI circuits.
He is roles include currently Director of Undergraduate Studies and Director of Research Programmes for the Systems Division.
He was a Visiting Scientist at the Nanyang Techological University in February/March 2011.
Expertise
Failure of electronic devices
Surface analysis techniques for thin film characterization
For a complete publication list see attached file
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Research topics include:
Modelling of failure mechanisms in VLSI circuits: Electromigration in interconnects, Electrostatic Discharge (ESD) damage.
Reliability in redundant systems with nonhomogeneous Poisson process flows.
Quantitative Surface Analysis.
MPEG compression algorithms
Undergraduate
ELA004 Signals and Systems
ELC011 VLSI Devices and Technology
ELD028 Semiconductor Devices
ELD062 Understanding Complexity
Postgraduate
ELD462 Understanding Complexity
Computer Aided Engineering (CAE) Labs for
ELA003, ELB000, ELC011
View all Dr Dwyer’s publications in the central publications database
Selected Publications
V.M.Dwyer, Modeling the Electromigration Failure Time Distribution in Short Copper Interconnects', J Appl Phys 104, (2008), 053708.
V. M. Dwyer, An Analytical Model of the Microstructure in Near-Bamboo Interconnects, J Phys D, 37, (2004), 422-431
P. C. Bressloff, V. M. Dwyer and M. J. Kearney, The localization-delocalization transition for drift diffusion in a random environment, Phys Rev Letts 25, (1996) 5075.
V. M. Dwyer, A. J. Franklin and D. S. Campbell, Thermal failure in semiconductor devices. Solid State Elect. 33, (1990) 553-560.
V. M. Dwyer and J. A. D. Matthew, The effects of elastic backscattering on the Auger or X-ray photoelectron spectra of solids. Surf. Sci. 143 (1984) 57-83.
